메뉴 건너뛰기




Volumn 57, Issue 6, 2010, Pages 1154-1165

Current mode image sensor with two transistors per pixel

Author keywords

Focal plane image sensors; Image sensors; Linear response; Low power sensors

Indexed keywords

IMAGE SENSORS; SIGNAL TO NOISE RATIO; TRANSISTORS;

EID: 77953480042     PISSN: 15498328     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2009.2030093     Document Type: Article
Times cited : (33)

References (43)
  • 1
    • 0000385677 scopus 로고
    • Self-scanned silicon image detector arrays
    • Apr.
    • P. J. W. Noble, "Self-scanned silicon image detector arrays," IEEE Trans. Electron Devices, vol.ED-15, no.4, pp. 202-209, Apr. 1968.
    • (1968) IEEE Trans. Electron Devices , vol.ED-15 , Issue.4 , pp. 202-209
    • Noble, P.J.W.1
  • 2
    • 0014621751 scopus 로고
    • Photosensitivity and Scanning of silicon image detector arrays
    • Jun.
    • S. G. Chamberlain, "Photosensitivity and Scanning of silicon image detector arrays," IEEE J. Solid-State Circuits, vol.JSSC-4, no.6, pp. 333-342, Jun. 1969.
    • (1969) IEEE J. Solid-State Circuits , vol.JSSC-4 , Issue.6 , pp. 333-342
    • Chamberlain, S.G.1
  • 3
    • 0031249402 scopus 로고    scopus 로고
    • CMOS image sensors: Electronic camera-on-a-chip
    • Oct.
    • E. R. Fossum, "CMOS image sensors: Electronic camera-on-a-chip, " IEEE Trans. Electron Devices, vol.44, no.10, pp. 1689-1698, Oct. 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , Issue.10 , pp. 1689-1698
    • Fossum, E.R.1
  • 8
    • 0031381630 scopus 로고    scopus 로고
    • A 1/4-inch 330 K square pixel progressive scan CMOS active pixel image sensor
    • Dec.
    • Y. Iida, E. Oba, K. Mabuchi, N. Nakamura, and H. Miura, "A 1/4-inch 330 K square pixel progressive scan CMOS active pixel image sensor," IEEE J. Solid-State Circuits, vol.32, no.12, pp. 2042-2047, Dec. 1997.
    • (1997) IEEE J. Solid-State Circuits , vol.32 , Issue.12 , pp. 2042-2047
    • Iida, Y.1    Oba, E.2    Mabuchi, K.3    Nakamura, N.4    Miura, H.5
  • 12
    • 33645736119 scopus 로고    scopus 로고
    • A 2.0 μm pixel pitch MOS image sensor with 1.5 transistor/pixel and an amorphous Si color filter
    • Apr.
    • M. Kasano, Y. Inaba, M. Mori, S. Kasuga, T. Murata, and T. Yamaguchi, "A 2.0 μm pixel pitch MOS image sensor with 1.5 transistor/pixel and an amorphous Si color filter," IEEE Trans. Electron Devices, vol.53, no.4, pp. 611-617, Apr. 2006.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.4 , pp. 611-617
    • Kasano, M.1    Inaba, Y.2    Mori, M.3    Kasuga, S.4    Murata, T.5    Yamaguchi, T.6
  • 15
  • 17
    • 0002076497 scopus 로고    scopus 로고
    • A retinomorphic vision system
    • K. A. Boahen, "A retinomorphic vision system," IEEE Micro, vol.16, pp. 30-39, 1996.
    • (1996) IEEE Micro , vol.16 , pp. 30-39
    • Boahen, K.A.1
  • 18
    • 33747041136 scopus 로고    scopus 로고
    • A simplified normal optical flow measurement CMOS camera
    • Jun.
    • S. Mehta and R. Etienne-Cummings, "A simplified normal optical flow measurement CMOS camera," IEEE Trans. Circuits Syst. I: Reg. Papers, vol.53, no.6, pp. 1223-1234, Jun. 2006.
    • (2006) IEEE Trans. Circuits Syst. I: Reg. Papers , vol.53 , Issue.6 , pp. 1223-1234
    • Mehta, S.1    Etienne-Cummings, R.2
  • 21
    • 0031251649 scopus 로고    scopus 로고
    • An artificial retina chip with current-mode focal plane image processing functions
    • Oct.
    • E. Funatsu, Y. Nitta, Y. Miyake, T. Toyoda, J. Ohta, and K. Kyuma, "An artificial retina chip with current-mode focal plane image processing functions," IEEE Trans. Electron Devices, vol.44, no.10, pp. 1777-1782, Oct. 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , Issue.10 , pp. 1777-1782
    • Funatsu, E.1    Nitta, Y.2    Miyake, Y.3    Toyoda, T.4    Ohta, J.5    Kyuma, K.6
  • 23
    • 12944266782 scopus 로고    scopus 로고
    • A general-purpose processor-per-pixel analog SIMD vision chip
    • Jan.
    • P. Dudek and P. J. Hicks, "A general-purpose processor-per-pixel analog SIMD vision chip," IEEE Trans. Circuits Syst. I, Reg. Papers, vol.52, no.1, pp. 13-20, Jan. 2005.
    • (2005) IEEE Trans. Circuits Syst. I, Reg. Papers , vol.52 , Issue.1 , pp. 13-20
    • Dudek, P.1    Hicks, P.J.2
  • 28
    • 34547977959 scopus 로고    scopus 로고
    • A 144 × 144 current-mode image sensor with self-adapting mismatch reduction
    • Aug.
    • Y. L. Wong and P. A. Abshire, "A 144 × 144 current-mode image sensor with self-adapting mismatch reduction," IEEE Trans. Circuits Syst. I, Reg. Papers, vol.54, no.8, pp. 1687-1697, Aug. 2007.
    • (2007) IEEE Trans. Circuits Syst. I, Reg. Papers , vol.54 , Issue.8 , pp. 1687-1697
    • Wong, Y.L.1    Abshire, P.A.2
  • 29
    • 0032188504 scopus 로고    scopus 로고
    • A 128-pixel CMOS image sensor with integrated analog nonvolatile memory
    • Oct.
    • A. Aslam-Siddiqi, W. Brockherde, M. Schanz, and B. J. Hosticka, "A 128-pixel CMOS image sensor with integrated analog nonvolatile memory," IEEE J. Solid-State Circuits, vol.33, no.10, pp. 1497-1501, Oct. 1998.
    • (1998) IEEE J. Solid-State Circuits , vol.33 , Issue.10 , pp. 1497-1501
    • Aslam-Siddiqi, A.1    Brockherde, W.2    Schanz, M.3    Hosticka, B.J.4
  • 31
    • 0031246970 scopus 로고    scopus 로고
    • Design and analysis of a 512 × 768 current-mediated active pixel array image sensor
    • Oct.
    • L. G. McIlrath, V. S. Clark, P. K. Duane, R. D. McGrath, and W. D. Waskurak, "Design and analysis of a 512 × 768 current-mediated active pixel array image sensor," IEEE Trans. Electron Devices, vol.44, no.10, pp. 1706-1715, Oct. 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , Issue.10 , pp. 1706-1715
    • McIlrath, L.G.1    Clark, V.S.2    Duane, P.K.3    McGrath, R.D.4    Waskurak, W.D.5
  • 32
    • 1942455418 scopus 로고    scopus 로고
    • An ultra-low power operating technique for mega-pixels current-mediated CMOS imagers
    • Jan.
    • F. Boussaid, A. Bermak, and A. Bouzerdoum, "An ultra-low power operating technique for mega-pixels current-mediated CMOS imagers," IEEE Trans. Consum. Electron., vol.50, no.1, pp. 46-53, Jan. 2004.
    • (2004) IEEE Trans. Consum. Electron. , vol.50 , Issue.1 , pp. 46-53
    • Boussaid, F.1    Bermak, A.2    Bouzerdoum, A.3
  • 36
    • 34548853151 scopus 로고    scopus 로고
    • Low fixed pattern noise current-mode imager using velocity saturated readout transistors
    • Y. Zheng, V. Gruev, and J. V. der Spiegel, "Low fixed pattern noise current-mode imager using velocity saturated readout transistors," in Proc. IEEE Int. Symp. Circuits and Systems, 2007, pp. 2842-2845.
    • (2007) Proc. IEEE Int. Symp. Circuits and Systems , pp. 2842-2845
    • Zheng, Y.1    Gruev, V.2    Der Spiegel, J.V.3
  • 39
    • 0035111662 scopus 로고    scopus 로고
    • Analysis of temporal noise in CMOS photodiode active pixel sensor
    • Jan.
    • T. Hui, B. Fowler, and A. E. Gamal, "Analysis of temporal noise in CMOS photodiode active pixel sensor," IEEE J. Solid-State Circuits, vol.36, no.1, pp. 92-101, Jan. 2001.
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.1 , pp. 92-101
    • Hui, T.1    Fowler, B.2    Gamal, A.E.3
  • 40
    • 0029720332 scopus 로고    scopus 로고
    • Noise properties of CMOS current conveyors
    • E. Bruun, "Noise properties of CMOS current conveyors," in Proc. IEEE Int. Symp. Circuits and Systems, 1996, vol.1, pp. 144-147.
    • (1996) Proc. IEEE Int. Symp. Circuits and Systems , vol.1 , pp. 144-147
    • Bruun, E.1
  • 42
    • 77953477732 scopus 로고    scopus 로고
    • [Online]. Available
    • [Online]. Available: http://www.mosis.org


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.