Atmospheric pressure surface sampling/ionization techniques for direct coupling of planar separations with mass spectrometry

Journal of Chromatography A

Volumn 1217, Issue 25, 2010, Pages 3955-3965

  Pasilis, Sofie P ^a   Van Berkel, Gary J ^b  

^a UNIVERSITY OF IDAHO   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Ambient; Atmospheric pressure chemical ionization; Electrospray; Ionization; Laser desorption; Mass spectrometry; Planar separations; Sampling probe; Secondary ionization; Surface sampling; Thermal desorption; Thin layer chromatography

Indexed keywords

AMBIENT; ATMOSPHERIC PRESSURE CHEMICAL IONIZATION; ELECTROSPRAY; LASER DESORPTION MASS SPECTROMETRY; PLANAR SEPARATIONS; SAMPLING PROBE; SAMPLING PROBES; SECONDARY IONIZATION; SURFACE SAMPLING;

ATMOSPHERIC CHEMISTRY; ATMOSPHERIC PRESSURE; ATMOSPHERICS; CHROMATOGRAPHIC ANALYSIS; ELECTROPHORESIS; ELECTROSPRAY IONIZATION; GELS; IONIZATION; MASS SPECTROMETRY; PARTICLE DETECTORS; PROBES; SURFACE CHEMISTRY; THERMAL DESORPTION; THIN FILMS; THIN LAYER CHROMATOGRAPHY;

ATMOSPHERIC IONIZATION;

ELUTION; LASER DESORPTION; LIQUID LIQUID EXTRACTION; LIQUID MICROJUNCTION SURFACE SAMPLING PROBE; MASS SPECTROMETRY; MATRIX ASSISTED LASER DESORPTION IONIZATION; PRIORITY JOURNAL; REVIEW; SEALING SURFACE SAMPLING PROBE; SEPARATION TECHNIQUE; THERMAL DESORPTION;

EQUIPMENT DESIGN; MASS SPECTROMETRY;

EID: 77953328849     PISSN: 00219673     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chroma.2009.10.064     Document Type: Review

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