Structural investigations in helium implanted cubic zirconia using grazing incidence XRD and EXAFS spectroscopy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 2177-2180

  Kuri, G ^a   Degueldre, C ^a   Bertsch, J ^a   Dobeli M ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Helium implantations; X ray absorption spectroscopy; Zirconia polymorphs

Indexed keywords

ATOM ARRANGEMENT; ATOMIC SCALE; CRYSTALLINITIES; CUBIC ZIRCONIA; EMBEDDED LAYERS; EXAFS; EXAFS DATA; EXAFS SPECTROSCOPY; FLUENCES; GLANCING ANGLE; GRAZING INCIDENCE; HELIUM IMPLANTATION; IMPLANTED SAMPLES; IMPLANTED SPECIMENS; INTERNAL STRESS; LOCAL PROBES; RHOMBOHEDRAL PHASE; SHORT-RANGE ORDERED; SINGLE BOND; STABILIZED ZIRCONIA; STRUCTURAL INVESTIGATION; STRUCTURAL MODIFICATIONS; STRUCTURAL PARAMETER; XRD; ZIRCONIA POLYMORPHS;

ABSORPTION; ATOMIC SPECTROSCOPY; ATOMS; CRYSTAL ATOMIC STRUCTURE; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; FOURIER TRANSFORMS; HELIUM; PLASMAS; POLYMORPHISM; RADIOACTIVITY; WAVELET TRANSFORMS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION; X RAYS; ZIRCONIA; ZIRCONIUM;

ABSORPTION SPECTROSCOPY;

EID: 77953326725     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.082     Document Type: Article

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