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Advanced Materials

Volumn 22, Issue 21, 2010, Pages 2349-2353

Induced sensitivity and selectivity in thin-film transistor sensors via calixarene layers www.MaterialsViews.com

(5) Sokolov, Anatoliy N a Roberts, Mark E b Johnson, Olasupo B a Cao, Yadong a Bao, Zhenan a

a Stanford University (United States)

b SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARENE MOLECULES; CALIXARENES; DEVICE PROPERTIES; REPRODUCIBILITIES; SENSOR LAYERS;

FIELD EFFECT TRANSISTORS; SENSORS; THIN FILM TRANSISTORS;

ORGANIC FIELD EFFECT TRANSISTORS;

CALIXARENE; ARTIFICIAL MEMBRANE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTRODE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; SEMICONDUCTOR; DEVICE FAILURE ANALYSIS; EVALUATION STUDY;

CALIXARENES; ELECTRODES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MEMBRANES, ARTIFICIAL; TRANSISTORS, ELECTRONIC;

EID: 77953175427 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.200903305 Document Type: Article

Times cited : (72)

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