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Volumn 157, Issue 7, 2010, Pages

Electrical and structural characterization of electroless nickel-phosphorus contacts for silicon solar cell metallization

(5) Boulord, C a Kaminski, A a Canut, B a Cardinal, S b Lemiti, M a

a ECOLE CENTRALE DE LYON (France)

b UNIVERSITÉ DE LYON (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALINITY; COPPER; METALLIZING; NICKEL COMPOUNDS; NICKEL PLATING; PHOSPHORUS; PHOSPHORUS COMPOUNDS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICIDES; SOLAR CELLS; X RAY DIFFRACTION;

CONTACT RESISTIVITIES; ELECTROLESS NICKEL PHOSPHORUS; ELECTROLESS NICKEL PLATING; GLANCING INCIDENCE X-RAY DIFFRACTIONS; RUTHERFORD BACK-SCATTERING SPECTROMETRY; SODIUM HYPOPHOSPHITE; STRUCTURAL CHARACTERIZATION; TRANSMISSION LINE MODELING;

SILICON SOLAR CELLS;

EID: 77953170170 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3391538 Document Type: Article

Times cited : (21)

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