Use of ultra-thin aluminum oxide layer to reduce photoluminescence decay in poly(p-phenylene vinylene) films

Thin Solid Films

Volumn 518, Issue 15, 2010, Pages 4367-4369

  Gedelian, Cynthia A ^a   Ou, Ya ^a   Li, Huafang ^a   Lu, Toh Ming ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

Aluminum oxide; Degradation; Photoluminescence; Poly(p phenylene vinylene); Transmission electron microscopy

Indexed keywords

ALUMINUM OXIDE; ALUMINUM OXIDES; BLUE LIGHT; EMITTING LAYER; EXCITATION WAVELENGTH; FREE OF CRACKS; PHOTOLUMINESCENCE DECAY; POLY(P-PHENYLENEVINYLENE); THIN LAYERS; TRANSMISSION ELECTRON; ULTRA-THIN; ULTRA-VIOLET LIGHT;

ALUMINUM; AROMATIC COMPOUNDS; DEGRADATION; LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED); ORGANIC POLYMERS; OXIDES; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

OXIDE FILMS;

EID: 77953135737     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.01.031     Document Type: Article

References (18)

1. Friend R.H., Gymer R.W., Holmes A.B., Burroughes J.H., Marks R.N., Taliani C., Bradley D.D.C., Dos Santos D.A., Bredas J.L., Lögdlund M., and Salaneck W.R. Nature 397 (1999) 121
2. Papadimitrakopoulos F., Konstadinidis K., Miller T.M., Opila R., Chandross E.A., and Galvin M.E. Chem. Mater. 6 (1994) 1563
3. Ghosh D., Samal G.S., Biswas A.K., and Mohapatra Y.N. Thin Solid Films 477 (2005) 162
4. Gobato Y.G., Marletta A., Faria R.M., Guimarães F.E.G., de Souza J.M., and Pereira E.C. Appl. Phys. Lett. 81 (2002) 942
5. Yan M., Rothberg L.J., Papadimitrakopoulos F., Galvin M.E., and Miller T.M. Phys. Rev. Lett. 73 (1994) 744
6. Klessinger M., and Michl J. Excited States and Photochemistry of Organic Molecules (1995), VCH Publishers, Inc., New York
7. Lee K., Kim J.Y., Park S.H., Kim S.H., Cho S., and Heeger A.J. Adv. Mater. 19 (2007) 2445
8. Riess W. Polym. Adv. Technol. 8 (1997) 381
9. Sellner S., Gerlach A., Schreiber F., Kelsch M., Kasper N., Dosch H., Meyer S., Pflaum J., Fischer M., Gompf B., and Ulbricht G. J. Mater. Res. 21 (2006) 455
10. Carcia P.F., McLean R.S., Reilly M.H., Groner M.D., and George S.M. Appl. Phys. Lett. 89 (2006) 031915
11. Ghosh A.P., Gerenser L.J., Jarman C.M., and Fornalik J.E. Appl. Phys. Lett. 86 (2005) 223503
12. Groner M.D., George S.M., McLean R.S., and Carcia P.F. Appl. Phys. Lett. 88 (2006) 051907
13. Burroughes J.H., Bradley D.D.C., Brown A.R., Marks R.N., Mackay K., Friend R.H., Burns P.L., and Holmes A.B. Nature 347 (1990) 539
14. Gedelian C.A., Ten Eyck G.A., and Lu T.-M. Synth. Met. 157 (2007) 48
15. Ahn H., and Whitten J.E. J. Appl. Phys. 93 (2003) 3384
16. Pang S.W., Kunz R.R., Rothschild M., Goodman R.B., and Horn M.W. J. Vac. Sci. Technol. B 7 (1989) 1624
17. Kobayashi T., Itoh Y., Nakano Y., Hirai E., Hashimoto R., and Kamikawa S. J. Vac. Sci. Technol. A 24 (2006) 939
18. Hunter M.S., and Fowle P. J. Electrochem. Soc. 103 (1956) 482