Mapping charge-mosaic surfaces in electrolyte solutions using surface charge microscopy

Applied Surface Science

Volumn 256, Issue 17, 2010, Pages 5381-5387

  Drelich, Jaroslaw ^a   Yin, Xihui ^a  

^a Michigan Technological University   (United States)

Author keywords

Atomic force microscopy; Colloidal probe; Surface charge density; Surface charge microscopy; Surface potential

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROLYTES; MAPPING; PROBES; SILICON NITRIDE; SUBSTRATES; SURFACE POTENTIAL; SURFACE PROPERTIES;

CHARGE CHARACTERISTICS; COLLOIDAL PROBES; ELECTROKINETIC MEASUREMENTS; HETEROGENEOUS SUBSTRATES; MICROSCOPIC RESOLUTION; REAL WORLD SITUATIONS; SURFACE HETEROGENEITIES; TECHNOLOGICAL SIGNIFICANCE;

SURFACE CHARGE;

EID: 77953133311     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.12.087     Document Type: Article

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