First results on ion micro-tomography at LIPSION

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 2001-2005

  Rothermel, M ^a   Reinert, T ^a   Andrea, T ^a   Butz, T ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

PIXE; STIM; Tomography

Indexed keywords

ANALYTICAL TECHNIQUES; APRIORI; BACK-PROJECTION; CORRECTION FACTORS; DATA SETS; DISCRETE IMAGES; ELEMENTAL COMPOSITIONS; ELEMENTAL DISTRIBUTION; EXPERIMENTAL DATA; FILTERED PROJECTIONS; HIGH RESOLUTION; MASS DENSITIES; MICRO-TOMOGRAPHY; PARTICLE INDUCED X-RAY EMISSION; PIXE; SAMPLE SIZES; SCANNING TRANSMISSION ION MICROSCOPY; SIMULATED DATA; SIMULATED DATASETS; UPPER LIMITS;

ALGORITHMS; ION BEAMS; IONS; REPAIR;

TOMOGRAPHY;

EID: 77953128030     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.117     Document Type: Article

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