Development of a microtomography system at the Lund sub-micron beamline

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 756-759

  Wegden M ^a   Elfman, M ^a   Kristiansson, P ^a   Marrero, N Arteaga ^a   Auzelyte, V ^a   Malmqvist, K G ^a   Nilsson, C ^a   Pallon, J ^a  

^a LUND INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Filtered backprojection; Nuclear microprobe; STIM; Tomography

Indexed keywords

COMPUTER AIDED ANALYSIS; LIGHT EMISSION; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL COMPUTER GRAPHICS; TOMOGRAPHY; X RAY ANALYSIS;

FILTERED BACKPROJECTION; ION BEAM TOMOGRAPHY; NUCLEAR MICROPROBES; SCANNING TRANSMISSION ION MICROSCOPY (STIM);

ION BEAMS;

EID: 33745820348     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.133     Document Type: Article

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