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Volumn 107, Issue 10, 2010, Pages
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Strain relaxation of epitaxial (Ba0.6 Sr0.4) (Zr 0.3 Ti0.7) O3 thin films grown on SrTiO 3 substrates by pulsed laser deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPRESSIVE STRAIN;
CRITICAL THICKNESS;
EPITAXIALLY GROWN;
HIGH-CRYSTALLINE QUALITY;
OUT-OF-PLANE LATTICES;
RECIPROCAL SPACE MAPPING;
SINGLE CRYSTAL SUBSTRATES;
SRTIO;
TETRAGONALITY;
BARIUM;
DEPOSITION;
PULSED LASER DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
STRONTIUM ALLOYS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZIRCONIUM;
PULSED LASERS;
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EID: 77952967954
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3380528 Document Type: Article |
Times cited : (2)
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References (9)
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