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Volumn 34, Issue 11, 2010, Pages 3560-3570

Sensitivity analysis of release time of software reliability models incorporating testing effort with multiple change-points

Author keywords

Multiple change points; Release time; Sensitivity analysis; Software reliability; Testing effort

Indexed keywords

CHANGE-POINTS; FAILURE DATA; GLOBAL PARAMETERS; GLOBAL SENSITIVITY ANALYSIS; INTERVAL ESTIMATION; MODEL PARAMETERS; NON-LINEAR MODEL; ONE-FACTOR; PARAMETERS ESTIMATED; RELEASE TIME; RELIABILITY CRITERION; SOFTWARE FAILURE; SOFTWARE RELIABILITY GROWTH MODELS; SOFTWARE RELIABILITY MODELS; TESTING EFFORT;

EID: 77952957476     PISSN: 0307904X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apm.2010.03.006     Document Type: Article
Times cited : (86)

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