Predicting software reliability

Computer

Volumn 29, Issue 11, 1996, Pages 69-77

  Wood, Alan ^a,b,c  

^a HEWLETT PACKARD COMPANY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c IEEE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEMS; CORRELATION METHODS; FUNCTIONS; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; RELIABILITY THEORY; SOFTWARE ENGINEERING; STATISTICAL METHODS;

DEFECT OCCURRENCE TIMES; SOFTWARE RELIABILITY GROWTH MODELS;

COMPUTER SOFTWARE;

EID: 0030286540     PISSN: 00189162     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/2.544240     Document Type: Review

References (5)

1. J. Tian, P. Lu, and J. Palma, "Test-Execution-Based Reliability Measurement and Modeling for Large Commercial Soft-ware," IEEE Trans. Software Eng., May 1995, pp. 405-414.
2. A. Wood, "Software Reliability Growth Models," Tandem Tech. Report 96-1, Tandem Computers Inc., Corporate Information Center, Cupertino, Calif., 1996.
3. J. Musa, A. Iannino, and K. Okumoto, Software Reliability, McGraw-Hill, New York, 1987.
4. W. Ehrlich, S.K. Lee, and R. Molisani, "Applying Reliability Measurement: A Case Study," IEEE Software, Mar. 1990, pp. 56-64.
5. A. Mood, F. Graybill, and D. Boes, Introduction to the Theory of Statistics, McGraw-Hill, New York, 1974.