Analysis of incorporating logistic testing-effort function into software reliability modeling

IEEE Transactions on Reliability

Volumn 51, Issue 3, 2002, Pages 261-270

  Huang, Chin Yu ^b   Kuo, Sy Yen ^a,b  

^a IEEE   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Mean value function; Nonhomogeneous poisson process; Optimal software release policy; Software reliability growth model; Testing effort function

Indexed keywords

EXPONENTIAL CURVE; LOGISTIC TESTING EFFORT FUNCTION; MEAN VALUE FUNCTION; NONHOMOGENEOUS POISSON PROCESS; RAYLEIGH CURVE; SOFTWARE RELIABILITY GROWTH MODEL; WEIBULL CURVE;

COMPUTER SOFTWARE SELECTION AND EVALUATION; ERROR CORRECTION; FAILURE ANALYSIS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARAMETER ESTIMATION; POISSON DISTRIBUTION; SOFTWARE ENGINEERING;

RELIABILITY;

EID: 0036733276     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.801847     Document Type: Article

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