Atomic force microscopy studies on the nanomechanical properties of Saccharomyces cerevisiae

Colloids and Surfaces B: Biointerfaces

Volumn 79, Issue 1, 2010, Pages 284-290

  Arfsten, Judith ^a   Leupold, Stefan ^a   Bradtmöller, Christian ^a   Kampen, Ingo ^a   Kwade, Arno ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

Atomic force microscopy; Baker's yeast; Force spectroscopy; Mechanical properties

Indexed keywords

AFM; APPROPRIATE MODELS; BAKER'S YEAST; EXTRACELLULAR; FORCE CURVE; FORCE SPECTROSCOPY; INTERACTION FORCES; MECHANICAL PARAMETERS; MICROBIAL CELLS; NANO-MECHANICAL BEHAVIORS; NANOMECHANICAL PROPERTY; OSMOTIC CONDITIONS; SACCHAROMYCES CEREVISIAE; SINGLE CELLS; SPECTROSCOPIC MEASUREMENTS; SPRING CONSTANTS; VERSATILE TOOLS; YEAST CELL; YOUNG'S MODULUS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; BIOMECHANICS; CELL CULTURE; CELL MEMBRANES; CELL PROLIFERATION; SURFACE CHEMISTRY; YEAST;

MECHANICAL PROPERTIES;

ARTICLE; ATOMIC FORCE MICROSCOPY; CELL POPULATION; CONTROLLED STUDY; ELASTICITY; MOLECULAR MECHANICS; NONHUMAN; OSMOSIS; PRIORITY JOURNAL; SACCHAROMYCES CEREVISIAE; YEAST CELL;

ELASTICITY; KINETICS; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; OSMOTIC PRESSURE; SACCHAROMYCES CEREVISIAE; STRESS, MECHANICAL;

SACCHAROMYCES CEREVISIAE;

EID: 77952950893     PISSN: 09277765     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfb.2010.04.011     Document Type: Article

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