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Volumn 40, Issue 10, 2008, Pages 1323-1327

Physical characteristics of Saccharomyces cerevisiae

Author keywords

Atomic force microscopy; Confocal microscopy; Elasticity; Nanoindentation; Saccharomyces cerevisiae

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; BIOLOGICAL SYSTEMS; CELL MEMBRANES; CELLS; CONFOCAL MICROSCOPY; CYTOLOGY; DEIONIZED WATER; ELASTICITY; ENGINEERING GEOLOGY; IMAGE ENHANCEMENT; MICROSCOPIC EXAMINATION; SALINE WATER; YEAST;

EID: 55349106212     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2899     Document Type: Article
Times cited : (21)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.