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Volumn 40, Issue 10, 2008, Pages 1323-1327
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Physical characteristics of Saccharomyces cerevisiae
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Author keywords
Atomic force microscopy; Confocal microscopy; Elasticity; Nanoindentation; Saccharomyces cerevisiae
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
BIOLOGICAL SYSTEMS;
CELL MEMBRANES;
CELLS;
CONFOCAL MICROSCOPY;
CYTOLOGY;
DEIONIZED WATER;
ELASTICITY;
ENGINEERING GEOLOGY;
IMAGE ENHANCEMENT;
MICROSCOPIC EXAMINATION;
SALINE WATER;
YEAST;
AFM CANTILEVERS;
AFM MEASUREMENTS;
ATOMIC FORCES;
CLEANED GLASS SUBSTRATES;
CONFOCAL IMAGES;
CONTACT REGIONS;
DI WATERS;
FORCE CURVES;
INDENTATION CURVES;
PBS SOLUTIONS;
PHYSICAL CHARACTERISTICS;
POROUS MEMBRANES;
QUANTITATIVE INFORMATIONS;
SACCHAROMYCES CEREVISIAE;
SALT BUFFERS;
TOPOGRAPHY IMAGES;
YEAST CELLS;
YOUNG'S MODULUS;
SCANNING PROBE MICROSCOPY;
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EID: 55349106212
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.2899 Document Type: Article |
Times cited : (21)
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References (16)
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