Crystal structure, electrical, and thermal properties of Ca 0.5Th0.5VO4

Journal of Materials Research

Volumn 24, Issue 12, 2009, Pages 3551-3558

  Patwe, Sadequa J ^a   Achary, S Nagabhusan ^a   Tyagi, Avesh K ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITY; ANISOTROPIC THERMAL EXPANSION; CHARGE DIFFERENCE; COEFFICIENTS OF THERMAL EXPANSIONS; HIGH-TEMPERATURE XRD; HIGHER TEMPERATURES; IMPEDANCE MEASUREMENT; IMPEDANCE SPECTROSCOPY; IN-SITU; POWDER X RAY DIFFRACTION; POWDER XRD; RELATIVE PERMITTIVITY; ROOM TEMPERATURE; SEMICONDUCTING BEHAVIOR; SINGLE SITES; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; THERMAL PROPERTIES; UNIT CELL PARAMETERS;

ACTIVATION ENERGY; CALCIUM; ELECTRIC PROPERTIES; RIETVELD METHOD; RIETVELD REFINEMENT; SILICATE MINERALS; THERMAL EXPANSION; THERMAL STRESS; X RAY DIFFRACTION;

CRYSTAL STRUCTURE;

EID: 77952660022     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0449     Document Type: Article

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