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Volumn 44, Issue 1, 2009, Pages 173-178
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Sintering, microstructure and microwave dielectric properties of rare earth orthophosphates, RePO4 (Re = La, Ce, Nd, Sm, Tb, Dy, Y, Yb)
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Author keywords
A. Ceramics; C. Electron microscopy; D. Dielectric properties; D. Microstructure
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Indexed keywords
BUILDING MATERIALS;
CERAMIC CAPACITORS;
CERAMIC MATERIALS;
CERIUM;
CERIUM COMPOUNDS;
CRYSTAL MICROSTRUCTURE;
CRYSTAL STRUCTURE;
ELECTRIC NETWORK ANALYSIS;
ELECTROMAGNETIC WAVES;
FIELD EMISSION;
IONIC STRENGTH;
LANTHANUM;
MICROSCOPIC EXAMINATION;
MICROSTRUCTURE;
MICROWAVES;
MONAZITE;
NATURAL FREQUENCIES;
NEODYMIUM;
PHOSPHATE MINERALS;
RARE EARTH ELEMENTS;
RHENIUM;
RHENIUM ALLOYS;
SINTERING;
TERBIUM ALLOYS;
X RAY ANALYSIS;
YTTERBIUM;
A. CERAMICS;
BOND STRENGTHS;
C. ELECTRON MICROSCOPY;
D. DIELECTRIC PROPERTIES;
D. MICROSTRUCTURE;
FIELD EMISSION SCANNING ELECTRON MICROSCOPIES;
HIGH QUALITIES;
IONIC POLARIZABILITY;
IONIC RADIUSES;
MEASURING FREQUENCIES;
MICROWAVE DIELECTRIC PROPERTIES;
MICROWAVE REGIONS;
MONAZITE STRUCTURES;
NEGATIVE VALUES;
NETWORK ANALYZERS;
RARE EARTH ORTHOPHOSPHATES;
SINTERED CERAMICS;
SOLID-STATE REACTIONS;
TEMPERATURE COEFFICIENT OF RESONANT FREQUENCIES;
X-RAY DIFFRACTIONS;
XENOTIME;
DIELECTRIC PROPERTIES;
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EID: 56249135604
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/j.materresbull.2008.03.016 Document Type: Article |
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Times cited : (81)
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References (27)
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