Single electron charging in optically active nanowire quantum dots

Nano Letters

Volumn 10, Issue 5, 2010, Pages 1817-1822

  Kouwen, Maarten P Van ^a   Reimer, Michael E ^a   Hidma, Anne W ^a   Van Weert, Maarten H M ^a   Algra, Rienk E ^b   Bakkers, Erik P A M ^a,b,c   Kouwenhoven, Leo P ^a   Zwiller, Val ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Nanowires; Optically active quantum dots; Opto electronics; Single electron charging

Indexed keywords

APPLIED ELECTRIC FIELD; BACK-GATE; CHARGE CONTROL; NANOWIRE GROWTH; OPTICAL EXPERIMENTS; OPTICALLY ACTIVE; OPTO-ELECTRONICS; QUANTUM DOT; SINGLE ELECTRON; SINGLE ELECTRON SPIN; SINGLE NANOWIRES; SINGLE-ELECTRON CHARGING; TUNNEL COUPLING;

ELECTRIC FIELDS; ELECTRONS; NANOWIRES; OPTICAL WAVEGUIDES; SEMICONDUCTOR QUANTUM DOTS; SPIN DYNAMICS;

ELECTRIC WIRE;

NANOMATERIAL; QUANTUM DOT;

ARTICLE; CHEMISTRY; ELECTRON TRANSPORT; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; NANOTECHNOLOGY; OPTICAL INSTRUMENTATION; PARTICLE SIZE; SEMICONDUCTOR; SIGNAL PROCESSING; ULTRASTRUCTURE;

ELECTRON TRANSPORT; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICAL DEVICES; PARTICLE SIZE; QUANTUM DOTS; SEMICONDUCTORS; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 77952409607     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl100520r     Document Type: Article

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