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Volumn 104, Issue 19, 2010, Pages
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Image scanning microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CCD DETECTION;
FLUORESCENCE IMAGING;
IMAGE SCANNING;
LASER SCANNING MICROSCOPY;
MICROSCOPY TECHNIQUE;
OPTICAL RESOLUTION;
PHYSICAL PRINCIPLES;
RESOLVING POWER;
STRUCTURED ILLUMINATION MICROSCOPY;
THEORETICAL FOUNDATIONS;
WIDE FIELD IMAGING;
WIDE-FIELD;
COPYING;
LASER APPLICATIONS;
SCANNING;
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EID: 77952369495
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.104.198101 Document Type: Article |
Times cited : (433)
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References (13)
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