Nanomechanics of CdSe quantum dot-polymer nanocomposite films

Nanotechnology

Volumn 21, Issue 22, 2010, Pages

  McCumiskey, Edward J ^a   Chandrasekhar, Natarajan ^b   Taylor, Curtis R ^a  

^a UNIVERSITY OF FLORIDA   (United States)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CDSE QDS; CDSE QUANTUM DOTS; CONCENTRATION OF; CONSTANT LOADS; DAMAGE RESISTANCE; DEFORMATION MECHANISM; ELECTRICAL AND OPTICAL PROPERTIES; ELECTROLUMINESCENT POLYMERS; INTERFACIAL SURFACE; LONG TERM STABILITY; MECHANICAL BEHAVIOUR; MECHANICAL CHARACTERIZATIONS; MEH-PPV; METHOXY; NANOCOMPOSITE DEVICES; NANOCOMPOSITE THIN FILMS; ORGANIC ELECTRONICS; PHENYLENEVINYLENE; POLYMER DEVICES; POLYMER NANOCOMPOSITE; QUANTUM DOT; QUASI-STATIC; SEVERAL VARIABLES; SURFACE LIGANDS; VISCOELASTIC BEHAVIOUR;

ATOMIC FORCE MICROSCOPY; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CREEP; DISPERSIONS; ELASTIC MODULI; ELECTRIC PROPERTIES; HARDNESS; MECHANICAL PROPERTIES; NANOCOMPOSITES; NANOINDENTATION; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

POLYMER FILMS;

EID: 77952361560     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/22/225703     Document Type: Article

References (29)

1. Shaheen S E, Ginley D S and Jabbour G E 2005 MRS Bull. 30 10-9
2. Loo Y and McCulloch I 2008 MRS Bull. 33 653-8
3. Greenham N C, Samuel I D W, Hayes G R, Phillips R T, Kessener Y A R R, Moratti S C, Holmes A B and Friend R H 1995 Chem. Phys. Lett. 241 89-96
4. Greenham N C, Peng X G and Alivisatos A P 1996 Phys. Rev. B 54 17628-37
5. Gunes S, Neugebauer H and Sariciftci N S 2007 Chem. Rev. 107 1324-38
6. Westenhoff S, Howard I A, Hodgkiss J M, Kirov K R, Bronstein H A, Williams C K, Greenham N C and Friend R H 2008 J. Am. Chem. Soc. 130 13653-8
7. Colvin V L, Schlamp M C and Alivisatos A P 1994 Nature 370 354-7
8. Dabbousi B O, Bawendi M G, Onitsuka O and Rubner M F 1995 Appl. Phys. Lett. 66 1316-8
9. Kamat P V 2008 J. Phys. Chem. C 112 18737-53
10. Ginger D S and Greenham N C 1999 Phys. Rev. B 59 10622-9
11. Schlamp M C, Peng X G and Alivisatos A P 1997 J. Appl. Phys. 82 5837-42
12. Nozik A J 2002 Physica E 14 115-20
13. Arango A C, Oertel D C, Xu Y F, Bawendi M G and Bulovic V 2009 Nano Lett. 9 860-3
14. Tsui T and Pharr G 1999 J. Mater. Res. 14 292-301
15. Doerner M and Nix W 1986 J. Mater. Res. 1 601-9
16. Briscoe B, Fiori L and Pelillo E 1998 J. Phys. D: Appl. Phys. 31 2395-405
17. Feng G and Ngan A 2002 J. Mater. Res. 17 660-8
18. Goorskey D 2008 personal communication
19. Sun B Q, Marx E and Greenham N C 2003 Nano Lett. 3 961-3
20. Huynh W U, Dittmer J J, Libby W C, Whiting G L and Alivisatos A P 2003 Adv. Funct. Mater. 13 73-9
21. Oliver W C and Pharr G M 1992 J. Mater. Res. 7 1564-83
22. McDonald S, Konstantatos G, Zhang S, Cyr P, Klem E, Levina L and Sargent E 2005 Nat. Mater. 4 138-42
23. ISO 14557-1 2002 Metallic materials-instrumented indentation test for hardness and materials parameters
24. Yang S, Zhang Y and Zeng K 2004 J. Appl. Phys. 95 3655
25. Cheng Y and Cheng C 2004 Mater. Sci. Eng. R 44 91-149
26. Nix W and Gao H 1998 J. Mech. Phys. Solids 46 411-25
27. Gerberich W, Tymiak N, Grunlan J, Horstemeyer M and Baskes M 2002 J. Appl. Mech. 69 433
28. Lee D, Jia S, Banerjee S, Bevk J, Herman I and Kysar J 2007 Phys. Rev. Lett. 98 26103
29. Adachi S 2004 Handbook on Physical Properties of Semiconductors vol 3 (Boston, MA: Kluwer Academic)