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Volumn 48, Issue 8 PART 3, 2009, Pages

Solution-TiO2 interface probed by frequency-modulation atomic force microscopy

(9) Hiasa, Takumi a Kimura, Kenjiro a Onishi, Hiroshi a Ohta, Masahiro b Watanabe, Kazuyuki b Kokawa, Ryohei b,c Oyabu, Noriaki c Kobayashi, Kei d Yamada, Hirofumi d

a KOBE UNIVERSITY (Japan)

b SHIMADZU CORPORATION (Japan)

c JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

d KYOTO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; DENSITY OF WATER; FORCE CURVE; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; HIGHLY SENSITIVE; IONIC SOLUTES; NUCLEATION AND GROWTH; SITE-SPECIFIC; SOLVATION STRUCTURE; TIO;

ATOMIC FORCE MICROSCOPY; FREQUENCY MODULATION;

IONIZATION OF LIQUIDS;

EID: 77952329040 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.48.08JB19 Document Type: Article

Times cited : (17)

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