Evolution of interdiffused gaussian-shape nanolayer in Au-Si(111) system at ambient condition

Defect and Diffusion Forum

Volumn 297-301, Issue , 2010, Pages 1133-1139

  Bal, J K ^a   Hazra, S ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Diffusion and interface formation; Gaussian shape nanolayer; Scanning tunneling microscopy; Surface passivation; Xray reflectometry

Indexed keywords

CHEMICAL BONDS; DANGLING BONDS; DIFFUSION; ELECTRONEGATIVITY; GAUSSIAN DISTRIBUTION; SCANNING TUNNELING MICROSCOPY; SILICON; DIFFUSION IN SOLIDS; HEAT TRANSFER;

AMBIENT CONDITIONS; BOND ENERGIES; GAUSSIAN SHAPE; INTERFACE FORMATION; NANO LAYERS; SI(111) SUBSTRATE; SURFACE PASSIVATION; X-RAY REFLECTOMETRY;

PASSIVATION;

EID: 77952264636     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/DDF.297-301.1133     Document Type: Conference Paper

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