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Volumn 438, Issue 1-3, 1999, Pages 18-25
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Population analysis study of etching processes at Si(100) surfaces with adsorbed halogens and hydrogens
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
BROMINE;
CHEMICAL BONDS;
CHEMISORPTION;
CHLORINE;
ELECTRONIC STRUCTURE;
ETCHING;
HYDROGEN;
PROBABILITY DENSITY FUNCTION;
SCANNING TUNNELING MICROSCOPY;
BOND CHARGE;
DENSITY FUNCTIONAL CALCULATIONS;
POPULATION ANALYSIS;
REPULSIVE INTERACTION;
SEMICONDUCTING SILICON;
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EID: 0033319286
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00539-7 Document Type: Article |
Times cited : (19)
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References (32)
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