메뉴 건너뛰기




Volumn , Issue , 2010, Pages 1555-1560

Reliability evaluation of three-level inverters

Author keywords

[No Author keywords available]

Indexed keywords

COMMON GROUND; INDIVIDUAL PREFERENCE; INVERTER TOPOLOGIES; MATHEMATICAL INDEXES; MULTI STATE; QUALITATIVE REASONING; QUANTITATIVE TECHNIQUES; RELIABILITY ASSESSMENTS; RELIABILITY EVALUATION; RELIABILITY INDEX; THREE-LEVEL INVERTERS;

EID: 77952212239     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2010.5433438     Document Type: Conference Paper
Times cited : (28)

References (11)
  • 2
    • 0034785065 scopus 로고    scopus 로고
    • A fault tolerant induction motor drive system by using a compensation strategy on the PWM-VSI topology
    • R. L. A. Ribeiro, C. B. Jacobina, E. R. C. da Silva, and A. M. N. Lima, "A fault tolerant induction motor drive system by using a compensation strategy on the PWM-VSI topology", in Proc. IEEE PESC'01, 2001, pp. 1191-1196.
    • Proc. IEEE PESC'01, 2001 , pp. 1191-1196
    • Ribeiro, R.L.A.1    Jacobina, C.B.2    Da Silva, E.R.C.3    Lima, A.M.N.4
  • 3
    • 0035330628 scopus 로고    scopus 로고
    • An induction motor drive system with improved fault tolerance
    • May/Jun.
    • M. B. R. Correa, C. B. Jacobina, E. R. C. Silva, and A. M. N. Lima, "An induction motor drive system with improved fault tolerance", IEEE Trans. Ind. Appl., vol. 37, no. 3, pp. 873-879, May/Jun. 2001.
    • (2001) IEEE Trans. Ind. Appl. , vol.37 , Issue.3 , pp. 873-879
    • Correa, M.B.R.1    Jacobina, C.B.2    Silva, E.R.C.3    Lima, A.M.N.4
  • 4
    • 33746875921 scopus 로고    scopus 로고
    • Strategies of fault tolerant operation for three-level PWM inverters
    • Jul.
    • S. Li and L. Xu, "Strategies of fault tolerant operation for three-level PWM inverters", IEEE Trans. Power Electron., vol. 21, no. 4, pp. 933-940, Jul. 2006.
    • (2006) IEEE Trans. Power Electron. , vol.21 , Issue.4 , pp. 933-940
    • Li, S.1    Xu, L.2
  • 5
    • 66949180475 scopus 로고    scopus 로고
    • Performance evaluation of three-level Z-source inverters under semiconductor-failure conditions
    • May/Jun.
    • F. Gao, P. C. Loh, F. Blaabjerg, and D. M. Vilathgamuwa, "Performance evaluation of three-level Z-source inverters under semiconductor-failure conditions", IEEE Trans. Ind. Appl., vol. 45, no. 3, pp. 971-981, May/Jun. 2009.
    • (2009) IEEE Trans. Ind. Appl. , vol.45 , Issue.3 , pp. 971-981
    • Gao, F.1    Loh, P.C.2    Blaabjerg, F.3    Vilathgamuwa, D.M.4
  • 7
    • 47049095543 scopus 로고    scopus 로고
    • Development of a methodology for improving photovoltaic inverter reliability
    • Jul.
    • A. Ristow, M. Begovic, A. Pregelj, and A. Rohatgi, "Development of a methodology for improving photovoltaic inverter reliability", IEEE Trans. Ind. Electron., vol. 55, no. 7, pp. 2581-2592, Jul. 2008.
    • (2008) IEEE Trans. Ind. Electron. , vol.55 , Issue.7 , pp. 2581-2592
    • Ristow, A.1    Begovic, M.2    Pregelj, A.3    Rohatgi, A.4
  • 8
    • 35348852091 scopus 로고    scopus 로고
    • A comparison of redundant inverter topologies to improve voltage source inverter reliability
    • Sep/Oct.
    • A. L. Julian and G. Oriti, "A comparison of redundant inverter topologies to improve voltage source inverter reliability", IEEE Trans. Ind. Appl., vol. 43, no. 5, pp. 1371-1378, Sep/Oct. 2007.
    • (2007) IEEE Trans. Ind. Appl. , vol.43 , Issue.5 , pp. 1371-1378
    • Julian, A.L.1    Oriti, G.2
  • 10
    • 34447622273 scopus 로고    scopus 로고
    • Extended block diagram method for a multi-state system reliability assessment
    • DOI 10.1016/j.ress.2006.09.013, PII S0951832006002183, ESREL 2005
    • A. Lisnianski, "Extended block diagram method for a multi-state system reliability assessment", Reliability Engineering and System Safety, vol. 92, no. 12, pp.1601-1607, 2007. (Pubitemid 47088931)
    • (2007) Reliability Engineering and System Safety , vol.92 , Issue.12 , pp. 1601-1607
    • Lisnianski, A.1
  • 11
    • 0003884053 scopus 로고
    • Military Handbook MIL-HDBK-217F, U.S. Dept. Defense, Washington, DC, Dec. 2
    • Military Handbook MIL-HDBK-217F, Reliability Prediction of Electronic Equipment, U.S. Dept. Defense, Washington, DC, Dec. 2, 1991.
    • (1991) Reliability Prediction of Electronic Equipment


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.