A comparison of redundant inverter topologies to improve voltage source inverter reliability

IEEE Transactions on Industry Applications

Volumn 43, Issue 5, 2007, Pages 1371-1378

  Julian, Alexander L ^a   Oriti, Giovanna ^b  

^a Naval Postgraduate School   (United States)

^b NONE

Author keywords

Mean time between failure (MTBF); Redundancy; Reliability; Voltage source inverter (VSI)

Indexed keywords

CAPACITORS; ELECTRIC CURRENT CONTROL; ELECTRIC NETWORK TOPOLOGY; ELECTRIC POTENTIAL; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); RELIABILITY; VLSI CIRCUITS; VOLTAGE CONTROL;

INVERTER TOPOLOGIES; MEAN TIME BETWEEN FAILURE (MTBF); VOLTAGE SOURCE INVERTER RELIABILITY;

ELECTRIC INVERTERS;

EID: 35348852091     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIA.2007.904436     Document Type: Article

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