Characterizing the effects of silver alloying in chalcopyrite CIGS solar cells with junction capacitance methods

Materials Research Society Symposium Proceedings

Volumn 1165, Issue , 2010, Pages 3-8

  Erslev, Peter T ^a   Hanket, Gregory M ^b   Shafarman, William N ^b   Cohen, J David ^a  

^a UNIVERSITY OF OREGON   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE PROFILING; CHARACTERIZATION METHODS; CIGS SOLAR CELLS; FREE CARRIER CONCENTRATION; JUNCTION CAPACITANCES; ORDER OF MAGNITUDE; PHOTOVOLTAIC SOLAR CELLS; STRUCTURAL DISORDERS; TANDEM DEVICES; TRANSIENT PHOTOCAPACITANCE SPECTROSCOPIES; URBACH EDGE; WIDE GAP;

ALLOYING; CAPACITANCE; COPPER COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SILVER; SOLAR CELLS; SOLAR POWER GENERATION;

SILVER ALLOYS;

EID: 77952035255     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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