Antimicrobial resistance patterns and characterization of integrons of Shigella sonnei isolates in Seoul, 1999-2008

Journal of Microbiology

Volumn 48, Issue 2, 2010, Pages 236-242

  Jin, Young hee ^a   Oh, Young hee ^a   Jung, Ji hun ^a   Kim, Soo jin ^a   Kim, Jin ah ^a   Han, Ki young ^a   Kim, Min young ^a   Park, Seog gee ^a   Lee, Young ki ^b  

^a Seoul National University Boramae Hospital   (South Korea)

^b Dankook University   (South Korea)

Author keywords

Antimicrobial resistance; Integron; PFGE; S. sonnei

Indexed keywords

ANTIINFECTIVE AGENT; BACTERIAL DNA;

ANTIBIOTIC RESISTANCE; ARTICLE; BACTERIUM IDENTIFICATION; CLASSIFICATION; CLUSTER ANALYSIS; DNA FINGERPRINTING; DNA SEQUENCE; DRUG EFFECT; GENETICS; HUMAN; INTEGRON; ISOLATION AND PURIFICATION; KOREA; MICROBIOLOGICAL EXAMINATION; MICROBIOLOGY; MOLECULAR EPIDEMIOLOGY; POLYMERASE CHAIN REACTION; PULSED FIELD GEL ELECTROPHORESIS; SHIGELLA SONNEI; SHIGELLOSIS;

ANTI-BACTERIAL AGENTS; BACTERIAL TYPING TECHNIQUES; CLUSTER ANALYSIS; DNA FINGERPRINTING; DNA, BACTERIAL; DRUG RESISTANCE, BACTERIAL; DYSENTERY, BACILLARY; ELECTROPHORESIS, GEL, PULSED-FIELD; HUMANS; INTEGRONS; KOREA; MICROBIAL SENSITIVITY TESTS; MOLECULAR EPIDEMIOLOGY; POLYMERASE CHAIN REACTION; SEQUENCE ANALYSIS, DNA; SHIGELLA SONNEI;

SHIGELLA SONNEI;

EID: 77951985557     PISSN: 12258873     EISSN: 12258873     Source Type: Journal    
DOI: 10.1007/s12275-010-9220-z     Document Type: Article

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