Antimicrobial resistance patterns and resistance genes assay of Shigella sonnei isolated in Korea for five years

Korean Journal of Microbiology

Volumn 43, Issue 1, 2007, Pages 31-39

  Huh, Wan ^b   Lee, Sang Jo ^b   Kwon, Gi Seok ^a   Jang, Jong Ok ^a   Lee, Jung Bok ^a  

^a Andong National University   (South Korea)

^b Gyeong Sang Buk Do   (South Korea)

Author keywords

Antibiotic resistance gene; Antibiotic resistance pattern; Shigella sonnei

Indexed keywords

SHIGELLA; SHIGELLA SONNEI;

EID: 34547610469     PISSN: 04402413     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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