A survey of fault detection, isolation, and reconfiguration methods

IEEE Transactions on Control Systems Technology

Volumn 18, Issue 3, 2010, Pages 636-653

  Hwang, Inseok ^a   Kim, Sungwan ^b   Kim, Youdan ^c   Seah, Chze Eng ^a  

^a Purdue University   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

^c Seoul National University   (South Korea)

Author keywords

Analytic redundancy; Fault detection; Fault isolation; Fault reconfiguration; Survey

Indexed keywords

ABRUPT CHANGE; ACTIVE AREA; ANALYTIC REDUNDANCY; CONTROL COMMUNITY; CONTROLLER RECONFIGURATION; ENGINEERING APPLICATIONS; FAULT DETECTION AND ISOLATION; FAULT ISOLATION; FAULT RECONFIGURATION; MODEL UNCERTAINTIES; MODEL-BASED; RECONFIGURABLE CONTROL; STATISTICAL TECHNIQUES; UNKNOWN DISTURBANCE;

QUALITY ASSURANCE; REDUNDANCY; SURVEYS; UNCERTAINTY ANALYSIS;

FAULT DETECTION;

EID: 77951880498     PISSN: 10636536     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCST.2009.2026285     Document Type: Article

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