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Volumn 25, Issue 5, 2010, Pages 631-634
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Quantification of energy dispersive SRXRF for the certification of reference materials at BAMline
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTICAL CHEMISTRY;
BACKGROUND SUBTRACTION;
ENERGY DISPERSIVE X-RAY FLUORESCENCE;
HARD X-RAY BEAMS;
MAIN TASKS;
MATERIALS RESEARCH;
MONTE CARLO SIMULATION;
PEAK OVERLAPPING;
PURE ELEMENTS;
QUANTIFICATION OF ENERGIES;
REFERENCE MATERIAL;
STOICHIOMETRIC COMPOUND;
THIN LAYERS;
COMPUTER SIMULATION;
ENERGY DISPERSIVE SPECTROSCOPY;
MONTE CARLO METHODS;
SYNCHROTRONS;
TRACE ELEMENTS;
MATERIALS TESTING;
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EID: 77951785059
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/b926596a Document Type: Article |
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Times cited : (21)
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References (9)
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