Investigation of a correction procedure for surface irregularity effects based on scatter peak intensities in the field analysis of geological and archaeological rock samples by portable X-ray fluorescence spectrometry

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 7, 1997, Pages 769-776

  Potts, Philip J ^a,b   Webb, Peter C ^a   Williams Thorpe, Olwen ^a  

^a OPEN UNIVERSITY   (United Kingdom)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Correction procedure; Portable instrumentation; Scatter peaks; Silicate rock; Surface irregularity effects; X ray fluorescence analysis

Indexed keywords

CADMIUM; ERROR CORRECTION; FLUORESCENCE; IRON; MEASUREMENT ERRORS; SILICATE MINERALS; SPECTROMETRY; X RAY ANALYSIS;

SURFACE IRREGULARITY EFFECTS; X RAY FLUORESCENCE SPECTROMETRY;

ROCKS;

EID: 0031176976     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a606639i     Document Type: Article

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