New developments in STED microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7578, Issue , 2010, Pages

  Giske, Arnold ^a   Sieber, Jochen ^a   Gugel, Hilmar ^a   Dyba, Marcus ^a   Seyfried, Volker ^a   Gnass, Dietmar ^a  

^a Leica Microsystems CMS   (Germany)

Author keywords

Fluorescence; Imaging; Microscopy; Superresolution

Indexed keywords

DIFFRACTION LIMITS; FLUORESCENCE IMAGING MICROSCOPY; FLUORESCENCE MARKERS; FLUORESCENT MARKERS; LASER SOURCES; LASER SYSTEMS; LIFE SCIENCE RESEARCH; LIGHT MICROSCOPY; RESOLUTION ENHANCEMENT; SOLID-STATE LASER SYSTEMS; STRUCTURAL DETAILS; SUPER RESOLUTION;

FLUORESCENCE; OPTICAL RESOLVING POWER; STIMULATED EMISSION;

SOLID STATE LASERS;

EID: 77951706052     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.843156     Document Type: Conference Paper

References (10)

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