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Volumn , Issue , 2010, Pages 228-229

Self-rectifying resistive memory based on Au nanocrystal-embedded zirconium oxide for crossbar array application

Author keywords

[No Author keywords available]

Indexed keywords

AU NANOCRYSTALS; CROSS-BAR STRUCTURES; CROSSBAR ARRAYS; CURRENT CONDUCTION MECHANISMS; E BEAM EVAPORATION; LOW-RESISTANCE STATE; RECTIFICATION RATIO; RESISTIVE SWITCHING BEHAVIORS; SWITCHING ELEMENTS; ZIRCONIUM OXIDE;

EID: 77951665053     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/INEC.2010.5424649     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 3
    • 34547346804 scopus 로고    scopus 로고
    • Nonvolatile memory elements based on organic materials
    • DOI 10.1002/adma.200602564
    • J. C. Scott and L. D. Bozano, "Nonvolatile memory elements based on organic materials," Adv. Mater. vol.19, pp. 1452-1463, 2007. (Pubitemid 47153147)
    • (2007) Advanced Materials , vol.19 , Issue.11 , pp. 1452-1463
    • Scott, J.C.1    Bozano, L.D.2
  • 6
    • 13944273678 scopus 로고    scopus 로고
    • Trap-limited hole mobility in semiconducting poly(3-hexylthiophene)
    • Z. Chiguvare and V. Dyakonov, "Trap-limited hole mobility in semiconducting poly(3-hexylthiophene)," Phys. Rev. B vol. 70, pp. 235207, 2004.
    • (2004) Phys. Rev. B , vol.70 , pp. 235207
    • Chiguvare, Z.1    Dyakonov, V.2
  • 7
    • 42349116747 scopus 로고    scopus 로고
    • Reliability characteristics of NiSi nanocrystals embedded in oxide and nitride layers for nonvolatile memory application
    • W. R. Chen, T. C. Chang, J. L. Yeh, S. M. Sze, and C. Y. Chang, "Reliability characteristics of NiSi nanocrystals embedded in oxide and nitride layers for nonvolatile memory application," Appl. Phys. Lett. vol.92, pp. 152114, 2008.
    • (2008) Appl. Phys. Lett. , vol.92 , pp. 152114
    • Chen, W.R.1    Chang, T.C.2    Yeh, J.L.3    Sze, S.M.4    Chang, C.Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.