Physical mechanisms of breakdown in multicrystalline silicon solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 000181-000186

  Breltenstein, O ^a   Bauer, J ^a   Wagner, J M ^a   Blumtritt, H ^a   Lotnyk, A ^a,b   Kasemann, M ^c   Kwapil, W ^c   Warta, W ^c  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

^c FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

1550 NM; AVALANCHE BREAKDOWN; AVALANCHE MULTIPLICATION; BREAKDOWN MECHANISM; BREAKDOWN SITES; DEFECT LEVELS; DEFECT LUMINESCENCE; EDGE BREAKDOWN; ETCH PITS; HIGH SLOPES; LATTER MECHANISM; MULTI-CRYSTALLINE SILICON SOLAR CELLS; PHYSICAL MECHANISM; PREBREAKDOWN; REVERSE BIAS; REVERSE CURRENTS; TEMPERATURE COEFFICIENT; TRAP ASSISTED TUNNELING;

DEFECTS; EDGE DISLOCATIONS; ELECTROLUMINESCENCE; LIGHT; POLYSILICON; SILICON SOLAR CELLS;

THERMAL CONDUCTIVITY;

EID: 77951595272     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411700     Document Type: Conference Paper

References (6)

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3. J. Bauer, J.-M. Wagner, A. Lotnyk, H. Blumtritt, B. Lim, J. Schmidt, O. Breitenstein, "Hot spots in multicrystalline solar cells: avalanche breakdown due to etch pits", Phys. Status Solidi RRL 3, 2009, pp. 40-42, DOl 10.1002/pssr.200802250
4. D. Lausch, K. Petter, H. v. Wenckstern, M. Grundmann, "Correlation of pre-breakdown sites and bulk defects in multicrystalline solar cells", Phys. Status Solidi RRL 3, 2009, pp. 70-72, DOI 10.1001/pssr.200802264
5. S. M. Sze and G. Gibbons, "Effect of Junction Curvature on Breakdown Voltage in Semiconductors", Solid-State Electronics 9, 1966, pp. 831-845
6. O. Breitenstein, P. Altermatt, K. Ramspeck, A. Schenk, "The origin of ideality factors n > 2 of shunts and surfaces in the dark I-V curves of Si solar Cells", Proc. 21st European Photovoltaic Solar Energy Conference, Dresden, 4.-8. September 2006, pp. 625-628