CMOS Geiger-mode avalanche photodiode detectors for time and intensity resolved measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7594, Issue , 2010, Pages

  Lawrence, William G ^a   Tozian, Tani ^a   Stapels, Christopher ^a   Christian, James F ^a   Derderian, Gregory D ^b   Derderian, Jeffrey P ^b   Varadi, Gyula ^a  

^a RADIATION MONITORING DEVICES INC   (United States)

^b Dipole Engineering   (United States)

Author keywords

Chemiluminescence; GPD; Photon counting; SPAD; TCSPC

Indexed keywords

ACTIVE-QUENCHING CIRCUITS; ALL DIGITAL; BIAS CONTROL; DETECTOR ARRAYS; DIGITAL SIGNAL-PROCESSING CIRCUITS; EXTERNAL FIELDS; FLUORESCENCE LIFETIMES; GEIGER MODE AVALANCHE PHOTODIODE; GEIGER MODES; GPD; HORSE-RADISH PEROXIDASE; MICROLITERS; MULTI-CHANNEL; PH DEPENDENCE; PHOTON COUNTING; PHOTON COUNTING DETECTORS; PROGRAMMABLE GATE ARRAY; QUANTUM DOT NANOPARTICLES; STANDARD CMOS; TIME-RESOLVED FLUORESCENCE MEASUREMENTS;

AVALANCHE PHOTODIODES; CHEMILUMINESCENCE; CMOS INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); FLUORESCENCE; GEIGER COUNTERS; LIGHT MEASUREMENT; OPTICAL WAVEGUIDES; OPTOELECTRONIC DEVICES; PHOTODIODES; PHOTONS; SEMICONDUCTOR DIODES; SEMICONDUCTOR QUANTUM DOTS; SIGNAL PROCESSING;

DETECTORS;

EID: 77951591258     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.839239     Document Type: Conference Paper

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