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Applied Physics Letters

Volumn 80, Issue 22, 2002, Pages 4100-4102

Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes

(5) Jackson, J C a Hurley, P K a Lane, B a Mathewson, A a Morrison, A P b

a UNIVERSITY COLLEGE CORK (Ireland)

b UNIVERSITY COLLEGE CORK (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCULAR DIODES; CURRENT DETECTION; DARK COUNT RATE; DARK COUNTS; EXPERIMENTAL STUDIES; GEIGER MODE AVALANCHE PHOTODIODE; HIGH-FIELD REGIONS; LARGE AREA DEVICES; ORDERS OF MAGNITUDE; PERIPHERAL COMPONENTS; REVERSE BIAS;

AVALANCHE PHOTODIODES; GEIGER COUNTERS;

LEAKAGE CURRENTS;

EID: 79956019792 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1483119 Document Type: Article

Times cited : (25)

References (11)

1
- 0000459441
- exa EXASER 0922-6435
- N. Nightingale, Exp. Astron. 1, 407 (1991). exa EXASER 0922-6435
- (1991) Exp. Astron. , vol.1 , pp. 407
- Nightingale, N.¹

2
- 0000682341
- rsi RSINAK 0034-6748
- A. Muller, N. Gisin, and J.-P. Pellaux, Rev. Sci. Instrum. 64, 1158 (1993). rsi RSINAK 0034-6748
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 1158
- Muller, A.¹ Gisin, N.² Pellaux, J.-P.³

3
- 0029291428
- rsi RSINAK 0034-6748
- T. Isoshima, Y. Isojima, K. Hakomori, K. Kikuchi, K. Nagai, and H. Nakagawa, Rev. Sci. Instrum. 66, 2922 (1995). rsi RSINAK 0034-6748
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 2922
- Isoshima, T.¹ Isojima, Y.² Hakomori, K.³ Kikuchi, K.⁴ Nagai, K.⁵ Nakagawa, H.⁶

4
- 79957935254
- 19-22 March 2001, Kobe, Japan (IEEE, New York
- J. C. Jackson, A. P. Morrison, P. Hurley, W. R. Harrell, D. Damjanovic, B. Lane, and A. Mathewson, Proceedings of the 14th IEEE International Conference on Microelectronic Test Structures, 19-22 March 2001, Kobe, Japan (IEEE, New York, 2002).
- (2002) Proceedings of the 14th IEEE International Conference on Microelectronic Test Structures
- Jackson, J.C.¹ Morrison, A.P.² Hurley, P.³ Harrell, W.R.⁴ Damjanovic, D.⁵ Lane, B.⁶ Mathewson, A.⁷

5
- 79957941496
- J. C. Jackson, A. P. Morrison, B. Lane, and A. Mathewson, Proceedings of the 13th Annual Meeting of IEEE/LEOS (2000).
- (2000) Proceedings of the 13th Annual Meeting of IEEE/LEOS
- Jackson, J.C.¹ Morrison, A.P.² Lane, B.³ Mathewson, A.⁴

6
- 79957962680
- J. C. Jackson, A. P. Morrison, B. Lane, V. Sinnis, and A. Mathewson, Proceedings of IEEE/SISPAD (2001).
- (2001) Proceedings of IEEE/SISPAD
- Jackson, J.C.¹ Morrison, A.P.² Lane, B.³ Sinnis, V.⁴ Mathewson, A.⁵

7
- 0015646873
- etd IETDAI 0018-9383
- R. J. McIntyre, IEEE Trans. Electron Devices 20, 637 (1973). etd IETDAI 0018-9383
- (1973) IEEE Trans. Electron Devices , vol.20 , pp. 637
- McIntyre, R.J.¹

8
- 0032099425
- jes JESOAN 0013-4651
- A. Czerwinski, E. Simoen, C. Claeys, K. Klima, D. Tomaszewski, J. Gibki, and J. Katcki, J. Electrochem. Soc. 145, 2107 (1998). jes JESOAN 0013-4651
- (1998) J. Electrochem. Soc. , vol.145 , pp. 2107
- Czerwinski, A.¹ Simoen, E.² Claeys, C.³ Klima, K.⁴ Tomaszewski, D.⁵ Gibki, J.⁶ Katcki, J.⁷

9
- 0032473239
- apl APPLAB 0003-6951
- E. Simoen, C. Claeys, A. Czerwinski, and J. Katcki, Appl. Phys. Lett. 72, 1054 (1998). apl APPLAB 0003-6951
- (1998) Appl. Phys. Lett. , vol.72 , pp. 1054
- Simoen, E.¹ Claeys, C.² Czerwinski, A.³ Katcki, J.⁴

10
- 0032138127
- etd IETDAI 0018-9383
- H.-D. Lee and J.-M. Hwang, IEEE Trans. Electron Devices 45, 1848 (1998). etd IETDAI 0018-9383
- (1998) IEEE Trans. Electron Devices , vol.45 , pp. 1848
- Lee, H.-D.¹ Hwang, J.-M.²

11
- 0004071496
- Wiley, New York
- D. K. Schroder, Semiconductor Material and Device Characterization. (Wiley, New York, 1990), p. 412.
- (1990) Semiconductor Material and Device Characterization , pp. 412
- Schroder, D.K.¹

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