Fine line printed and plated contacts on high ohmic emitters enabling 20% cell efficiency

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 000060-000065

  Horteis M ^a   Grote, D ^a   Binder, S ^a   Filipovic, A ^a   Schmidt, D ^a   Glunz, S W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CELL EFFICIENCY; CONTACT FORMATION; CONTACT PERFORMANCE; CONTACT STRUCTURE; DOPING PROFILES; ELECTROCHEMICAL CAPACITANCE VOLTAGE; FRAUNHOFER; HIGH FILLS; HIGH-EFFICIENCY CELLS; METAL-SEMICONDUCTOR JUNCTIONS; METALLIZATIONS; REAR SURFACES; SCREEN PRINT; SCREEN-PRINTED; SECONDARY ION MASS SPECTROSCOPY; SEED LAYER; SHEET RESISTIVITY; SURFACE CONCENTRATION;

DOPING (ADDITIVES); ELECTRIC RESISTANCE; INK; PHOSPHORUS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS;

CELLS;

EID: 77951582174     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411742     Document Type: Conference Paper

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