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Volumn 12, Issue , 2010, Pages
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Exploration of crystal strains using coherent x-ray diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
ATTACHMENT PROCESS;
BRAGG PEAKS;
COHERENT X-RAY DIFFRACTION;
CRYSTAL STRAINS;
DENSITY DISTRIBUTIONS;
ERROR REDUCTION;
GAIN INFORMATION;
INPUT-OUTPUT;
INTERNAL STRAINS;
STRAIN FIELDS;
THREE DIMENSIONAL IMAGES;
DIFFRACTION GRATINGS;
DIFFRACTION PATTERNS;
HOLOGRAPHIC INTERFEROMETRY;
SILICATE MINERALS;
STRAIN;
THREE DIMENSIONAL;
X RAY DIFFRACTION;
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EID: 77951559656
PISSN: 13672630
EISSN: None
Source Type: Journal
DOI: 10.1088/1367-2630/12/3/035022 Document Type: Article |
Times cited : (30)
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References (16)
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