-
2
-
-
84958184092
-
A new approach to improve transporting efficiency of amhs
-
Dong-Yeh, J., Y. Chen-Chung, S. Yean-Jyh, and Y. Jorsun. 2002. A new approach to improve transporting efficiency of amhs. In Semiconductor Manufacturing Technology Workshop, 115-118.
-
(2002)
Semiconductor Manufacturing Technology Workshop
, pp. 115-118
-
-
Dong-Yeh, J.1
Chen-Chung, Y.2
Yean-Jyh, S.3
Jorsun, Y.4
-
3
-
-
46149124132
-
Interoperating simulation of automatic material handling systems and manufacturing process
-
ed. L. F. Perrone, F. P. Wieland, J. Liu, B. G. Lawson, D. M. Nicol, and R. M. Fujimoto, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc
-
Gan, B. P., L. P. Chan, and S. J. Turner. 2006. Interoperating simulation of automatic material handling systems and manufacturing process. In Proceedings of the 2006 Winter Simulation Conference, ed. L. F. Perrone, F. P. Wieland, J. Liu, B. G. Lawson, D. M. Nicol, and R. M. Fujimoto, 1129-1135. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
-
(2006)
Proceedings of the 2006 Winter Simulation Conference
, pp. 1129-1135
-
-
Gan, B.P.1
Chan, L.P.2
Turner, S.J.3
-
4
-
-
60749089934
-
Simulations analysis of cluster tool operations in wafer fabrication
-
ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc
-
Gupta, A. K., P. Lendermann, A. I. Sivakumar, and J. Priyadi. 2008. Simulations analysis of cluster tool operations in wafer fabrication. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, 2141-2147. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
-
(2008)
Proceedings of the 2008 Winter Simulation Conference
, pp. 2141-2147
-
-
Gupta, A.K.1
Lendermann, P.2
Sivakumar, A.I.3
Priyadi, J.4
-
5
-
-
55649125311
-
Levels of capacity and material handling system modeling for factory integration decision making in semiconductor wafer fabs
-
Jimenez, J. A., G. T. Mackulak, and J. W. Fowler. 2008. Levels of capacity and material handling system modeling for factory integration decision making in semiconductor wafer fabs. IEEE Transactions on Semiconductor Manufacturing 21 (4): 600-613.
-
(2008)
IEEE Transactions on Semiconductor Manufacturing
, vol.21
, Issue.4
, pp. 600-613
-
-
Jimenez, J.A.1
Mackulak, G.T.2
Fowler, J.W.3
-
6
-
-
33846680150
-
-
Technical report, Department of Operations Research, Washington University, Washington, California
-
Jones, K. C. 1992. Manufacturing simulation using virtual reality. Technical report, Department of Operations Research, Washington University, Washington, California.
-
(1992)
Manufacturing Simulation Using Virtual Reality
-
-
Jones, K.C.1
-
7
-
-
77951522928
-
Improve vehicle management for large unified amhs in semiconductor manufacturing facilities
-
ed. E. Kimberly, M. Russel, K. Michael, A. Brett, D. D. Taylor, and J. Usher. Dortmund, Deutchland: Material Handling Institute
-
Kiba, J.-E., S. Dauzere-Peres, C. Yugma, and L. Vermarien. 2008. Improve vehicle management for large unified amhs in semiconductor manufacturing facilities. In Progress In Material Handling Research: 2008, ed. E. Kimberly, M. Russel, K. Michael, A. Brett, D. D. Taylor, and J. Usher. Dortmund, Deutchland: Material Handling Institute.
-
(2008)
Progress in Material Handling Research: 2008
-
-
Kiba, J.-E.1
Dauzere-Peres, S.2
Yugma, C.3
Vermarien, L.4
-
10
-
-
33947584391
-
Two-step simulation method for automatic material handling system of semiconductor fab
-
DOI 10.1016/j.rcim.2006.05.004, PII S073658450600072X
-
Kong, S. 2007. Two-step simulation method for automatic material handling system of semiconductor fab. Robotics and Computer-Integrated Manufacturing 23 (4): 409-420. (Pubitemid 46482932)
-
(2007)
Robotics and Computer-Integrated Manufacturing
, vol.23
, Issue.4
, pp. 409-420
-
-
Kong, S.H.1
-
11
-
-
60749090293
-
Automated generation and parameterization of throughput models for semiconductor tools
-
ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc
-
Lange, J., K. Schmidt, R. Boner, and O. Rose. 2008. Automated generation and parameterization of throughput models for semiconductor tools. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, 2335-2340. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
-
(2008)
Proceedings of the 2008 Winter Simulation Conference
, pp. 2335-2340
-
-
Lange, J.1
Schmidt, K.2
Boner, R.3
Rose, O.4
-
14
-
-
33749672460
-
A heuristic approach to auto-recovery in the supervisory control of heterogeneous automatic equipment for material handling
-
DOI 10.1109/IECON.2005.1569266, 1569266, IECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society
-
Luo, M., J. B. Zhang, M. M. Wong, L. Q. Zhuang, K. C. Ng, and S. W. Aung. 2005. A heuristic approach to auto-recovery in the supervisory control of heterogeneous automatic equipment for material handling. In Proceedings of the 31st Annual Conference of the IEEE Industrial Electronics Society, 2325-2330. (Pubitemid 44549640)
-
(2005)
IECON Proceedings (Industrial Electronics Conference)
, vol.2005
, pp. 2325-2330
-
-
Luo, M.1
Zhang, J.B.2
Wong, M.M.3
Zhuang, L.Q.4
Ng, K.C.5
Aung, S.W.6
-
15
-
-
35348906323
-
Expected response times for closed-loop multivehicle AMHS
-
DOI 10.1109/TASE.2007.906141
-
Nazzal, D., and F. McGinnis. 2007. Expected response times for closed-loop multivehicle amhs. IEEE Transactions on Automation Science and Engineering 4 (4): 533-542. (Pubitemid 47573848)
-
(2007)
IEEE Transactions on Automation Science and Engineering
, vol.4
, Issue.4
, pp. 533-542
-
-
Nazzal, D.1
McGinnis, L.F.2
-
16
-
-
60749128347
-
Simulation analysis of semiconductor manufacturing with small lot size and batch tool replacements
-
ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, and J. W. F. T. Jefferson, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc
-
Schmidt, K., and O. Rose. 2008. Simulation analysis of semiconductor manufacturing with small lot size and batch tool replacements. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, and J. W. F. T. Jefferson, 2118-2126. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
-
(2008)
Proceedings of the 2008 Winter Simulation Conference
, pp. 2118-2126
-
-
Schmidt, K.1
Rose, O.2
-
17
-
-
4344579194
-
High-speed amhs and its operation methods for 300mm qtat fab
-
Wakabayashi, T., S. Watanabe, Y. Kobayashi, T. Okabe, and A. Koike. 2004. High-speed amhs and its operation methods for 300mm qtat fab. IEEE Transactions on Semiconductor Manufacturing 17 (3): 25-28.
-
(2004)
IEEE Transactions on Semiconductor Manufacturing
, vol.17
, Issue.3
, pp. 25-28
-
-
Wakabayashi, T.1
Watanabe, S.2
Kobayashi, Y.3
Okabe, T.4
Koike, A.5
-
18
-
-
50249135389
-
The effects of small lot manufacturing on amhs operation and equipment front-end design
-
ed. S. Mason, R. Hill, L. Mönch, O. Rose, and J. F. T. Jefferson
-
Zimmerhackl, O., J. Rothe, K. Schmidt, L. Marshall, and A. Honold. 2007. The effects of small lot manufacturing on amhs operation and equipment front-end design. In Proceedings of the 2007 international Symposium on Semiconductor Manufacturing, ed. S. Mason, R. Hill, L. Mönch, O. Rose, and J. F. T. Jefferson, 1-5.
-
(2007)
Proceedings of the 2007 International Symposium on Semiconductor Manufacturing
, pp. 1-5
-
-
Zimmerhackl, O.1
Rothe, J.2
Schmidt, K.3
Marshall, L.4
Honold, A.5
-
19
-
-
60749133494
-
Determining an appropriate number of foups in semiconductor wafer fabrication facilities
-
ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc
-
Zimmermann, J., L. Mönch, J. S. Mason, and J.W. Fowler. 2008. Determining an appropriate number of foups in semiconductor wafer fabrication facilities. In Proceedings of the 2008 Winter Simulation Conference, ed. S. J. Mason, R. R. Hill, L. Mönch, O. Rose, T. Jefferson, and J. W. Fowler, 189-192. Piscataway, New Jersey: Institute of Electrical and Electronics Engineers, Inc.
-
(2008)
Proceedings of the 2008 Winter Simulation Conference
, pp. 189-192
-
-
Zimmermann, J.1
Mönch, L.2
Mason, J.S.3
Fowler, J.W.4
|