Hierarchical current density verification for electromigration analysis in arbitrarily shaped metallization patterns of analog circuits

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 464-469

  Jerke, Göran ^a   Lienig, Jens ^a  

^a ROBERT BOSCH GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL DESIGN; DESIGN RULE CHECKS; ELECTROMIGRATION ANALYSIS; ELECTRONIC DEVICE; HIERARCHICAL VERIFICATION; HIGH CURRENT DENSITIES; TEMPERATURE DEPENDENCIES; THERMAL SIMULATIONS;

CURRENT DENSITY; DESIGN; ELECTROMIGRATION; EXHIBITIONS; METALLIZING;

ANALOG CIRCUITS;

EID: 77951153495     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998314     Document Type: Conference Paper

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