Quantification of microstructure refinement in aluminium deformed by equal channel angular extrusion: Route A vs. route Bc in a 90° die

Scripta Materialia

Volumn 63, Issue 1, 2010, Pages 20-23

  Mishin, Oleg V ^a   Bowen, Jacob R ^a   Lathabai, Sri ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b CSIRO   (Australia)

Author keywords

Aluminium; Deformation structure; Electron backscatter diffraction (EBSD); Equal channel angular extrusion (ECAE)

Indexed keywords

COMMERCIAL PURITY; DEFORMATION STRUCTURE; ELECTRON BACK SCATTER DIFFRACTION; EQUAL CHANNEL ANGULAR EXTRUSION; HIGH ANGLE BOUNDARIES; LOCAL HETEROGENEITY; MICROSTRUCTURE REFINEMENT; MIS-ORIENTATION;

ALUMINUM; BACKSCATTERING; DEFORMATION; DIES; ELECTRON DIFFRACTION; MICROSTRUCTURE; ROTATION;

EXTRUSION;

EID: 77951120003     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2010.02.042     Document Type: Article

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