EBSD-based dislocation microscopy

Solid State Phenomena

Volumn 160, Issue , 2010, Pages 3-10

  Adams, Brent L ^a   Gardner, Calvin J ^a   Fullwood, David T ^a  

^a Brigham Young University   (United States)

Author keywords

Dislocation tensor; EBSD; Electron backscatter diffraction; Electron microscopy; Strain localization

Indexed keywords

ANISOTROPY; BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; TENSORS; TEXTURES; ELECTRON MICROSCOPY;

D TYPES; DISLOCATION THEORY; EBSD; ELASTIC PROPERTIES; ELECTRON BACK SCATTER DIFFRACTION; GEOMETRICALLY NECESSARY DISLOCATIONS; HIGH RESOLUTION; HIGH RESOLUTION DATA; SINGLE GRAIN BOUNDARIES; STRAIN LOCALIZATIONS; HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTIONS;

HIGH RESOLUTION ELECTRON MICROSCOPY; POLYCRYSTALS;

EID: 77950986094     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.160.3     Document Type: Conference Paper

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