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Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 616, Issue 2-3, 2010, Pages 207-211

An LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors

(4) Polack, François a Thomasset, Muriel a Brochet, Sylvain a Rommeveaux, Amparo b

a SYNCHROTRON SOLEIL (France)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

Calibration; Data processing; Figure error; Instrument error; Linearity; Long trace profiler; Optical surface; Slope error

Indexed keywords

CALIBRATION DATA; CURVED MIRROR; CURVED SURFACES; FIGURE ERROR; INDEPENDENT MEASUREMENT; LINEARITY ERRORS; LONG TRACE PROFILER; OPTICAL SURFACES; SLOPE PROFILE;

CALIBRATION; DATA ACQUISITION; INSTRUMENTS; LASER OPTICS; LINEARIZATION; MEASUREMENT ERRORS; MIRRORS; OPTICAL DESIGN;

INSTRUMENT ERRORS;

EID: 77950934544 PISSN: 01689002 EISSN: None Source Type: Journal
DOI: 10.1016/j.nima.2009.10.166 Document Type: Article

Times cited : (44)

References (5)

1
- 85103624946
- Modern developments in X-ray and Neutron Optics
- A. Erko, et al, Eds
- A. Rommeveaux, M. Thomasset, D. Cocco, F. Siewert, in: A. Erko, et al., (Eds.), Modern developments in X-ray and Neutron Optics, Springer series in optical Sciences, Vol. 137, 2008, pp. 181-191.
- (2008) Springer series in optical Sciences , vol.137 , pp. 181-191
- Rommeveaux, A.¹ Thomasset, M.² Cocco, D.³ Siewert, F.⁴

2
- 42149154056
- Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-X-ray mirrors
- A. Rommeveaux, L. Assoufid, H. Ohashi, H. Mimura, K. Yamauchi, J. Qian, T. Ishikawa, C. Morawe, A.T. Macrander, A. Khounsary, S. Goto, Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-X-ray mirrors, in: Advances in Metrology for X-ray and EUV Optics II, San Diego, CA, USA-2007-08-30, Proceedings SPIE 6704, 67040B-1-67040B-12, 2007.
- (2007) Advances in Metrology for X-ray and EUV Optics II, San Diego, CA, USA-2007-08-30, Proceedings SPIE 6704, 67040B-1-67040B-12
- Rommeveaux, A.¹ Assoufid, L.² Ohashi, H.³ Mimura, H.⁴ Yamauchi, K.⁵ Qian, J.⁶ Ishikawa, T.⁷ Morawe, C.⁸ Macrander, A.T.⁹ Khounsary, A.¹⁰ Goto, S.¹¹

3
- 77950929878
- Simultaneous estimation of the surface shape and the instrument error function from a highly redundant set of LTP data
- October, Trieste Italy
- F. Polack, M. Thomasset, Simultaneous estimation of the surface shape and the instrument error function from a highly redundant set of LTP data, in: Second Workshop on Active X-ray Optics, 9-11 October 2008, Trieste Italy, 〈http://elettra.trieste.it/actop08/uploads/Main/p13.pdf〉.
- (2008) Second Workshop on Active X-ray Optics, 9-11
- Polack, F.¹ Thomasset, M.²

4
- 77950954016
- E. Anderson, Z. Bai, C. Bischof, J. Demmel, J.J. Dongarra, J.J. Du Croz, A. Greenbaum, S. Hammarling, A. McKenney, S. Blackford, D. Sorensen, LAPACK Users' Guide, third ed., SIAM, Philadelphia, 1999; inline version: 〈http://www.netlib.org/lapack/lug/lapack_lug.html〉 page 〈http://www.netlib.org/lapack/lug/node39.html〉.
- E. Anderson, Z. Bai, C. Bischof, J. Demmel, J.J. Dongarra, J.J. Du Croz, A. Greenbaum, S. Hammarling, A. McKenney, S. Blackford, D. Sorensen, LAPACK Users' Guide, third ed., SIAM, Philadelphia, 1999; inline version: 〈http://www.netlib.org/lapack/lug/lapack_lug.html〉 page 〈http://www.netlib.org/lapack/lug/node39.html〉.

5
- 61149163924
- OriginLab Corporation, MA, USA
- OriginLab Corporation, Northampton, MA, 01060 USA.
- Northampton , pp. 01060

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