|
Volumn 496, Issue 1-2, 2010, Pages 265-268
|
Study of nanocomposite iron/porous silicon material
|
Author keywords
Iron PS composite materials; Microstructure; Nanostructured material; Optical spectroscopy; Scanning electron microscopy (SEM)
|
Indexed keywords
BROAD SPECTRUM;
ELECTROCHEMICAL DEPOSITION;
ELECTROCHEMICAL PROCESS;
FABRICATION PROCESS;
IRON IONS;
IRON SALTS;
IRON/PS COMPOSITE MATERIALS;
MATRIX;
MICROELEMENTS;
OPTICAL SPECTROSCOPY;
POROUS STRUCTURES;
SEM;
SILICON MATERIALS;
TEST STRUCTURE;
THERMAL TREATMENT;
COMPOSITE MATERIALS;
COMPOSITE MICROMECHANICS;
IRON OXIDES;
METAL IONS;
MICROSTRUCTURE;
NANOCOMPOSITES;
NANOSTRUCTURED MATERIALS;
POROUS SILICON;
REDUCTION;
TRACE ELEMENTS;
SCANNING ELECTRON MICROSCOPY;
|
EID: 77950862274
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.01.058 Document Type: Article |
Times cited : (10)
|
References (16)
|