Robust and high performance subthreshold standard cell design

Midwest Symposium on Circuits and Systems

Volumn , Issue , 2009, Pages 1183-1186

  Amarchinta, S ^a   Kanitkar, H ^a   Kudithipudi, D ^a  

^a Rochester Institute of Technology   (United States)

Author keywords

Minimum energy point; Standard cell library; Subthreshold; Transistor utility factor

Indexed keywords

CELL LIBRARY; DELAY VARIATION; ENERGY DELAY PRODUCT; HIGH-PERFORMANCE CELL; LOW POWER; MINIMUM ENERGY POINT; OPTIMAL DESIGN; PERFORMANCE IMPROVEMENTS; PROCESS VARIATION; STANDARD CELL; STANDARD CELL DESIGN; SUBTHRESHOLD; SUBTHRESHOLD CIRCUITS; SUBTHRESHOLD TRANSISTORS; WORST CASE;

DESIGN; DIGITAL CIRCUITS; ELECTRIC BATTERIES; STANDARDS;

CELLS;

EID: 77950678316     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2009.5235946     Document Type: Conference Paper

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