Process selection for higher production yield based on capability index Spk

Quality and Reliability Engineering International

Volumn 26, Issue 3, 2010, Pages 247-258

  Lin, Chen Ju ^a   Pearn, W L ^b  

^a YUAN ZE UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Non conformities; Process capability index; Process selection; Production yield

Indexed keywords

APPLICATION EXAMPLES; CAPABILITY INDICES; CONFIDENCE LEVELS; CRITICAL VALUE; EXACT APPROACH; PROCESS CAPABILITY INDICES; PROCESS SELECTION; PRODUCTION PROCESS; PRODUCTION YIELD; REAL PROBLEMS; SAMPLE SIZES; SELECTION DECISIONS; TESTING HYPOTHESIS; TWO PHASIS;

INDUSTRIAL ENGINEERING; LIQUID CRYSTAL DISPLAYS; PROCESS CONTROL; PRODUCTION; THIN FILM TRANSISTORS;

PROBLEM SOLVING;

EID: 77950630678     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.1051     Document Type: Article

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