Normal approximation to the distribution of the estimated yield index Spk

Quality and Quantity

Volumn 38, Issue 1, 2004, Pages 95-111

  Pearn, W L ^a   Lin, G H ^b   Wang, K H ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL PENGHU UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

Critical value; Process yield

Indexed keywords

EID: 3843072192     PISSN: 00335177     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:QUQU.0000013245.13104.1d     Document Type: Article

References (3)

1. Boyles, R. A. (1994). Process capability with asymmetric tolerances. Communication in Statistics: Simulation and Computation 23(3): 615-643.
2. pk. Quality & Reliability Engineering International. To appear.
3. Pearn, W. L., Lin, G. H. & Chen, K. S. (1998). Distributional and inferential properties of the process accuracy and process precision indices. Communications in Statistics: Theory & Methods 27(4): 985-1000.