Determination of nanometric Ag2O film thickness by surface plasmon resonance and optical waveguide mode coupling techniques

Journal of Optics A: Pure and Applied Optics

Volumn 12, Issue 4, 2010, Pages

  Santillán, Jesica M J ^a   Scaffardi, Lucía B ^a,b   Schinca, Daniel C ^a,b   Videla, Fabián A ^a,b  

^a Centro Científico y Tecnológico Consejo Nacional de Investigaciones Científicas y Técnicas   (Argentina)

^b UNIVERSIDAD NACIONAL DE LA PLATA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION CURVES; CONTINUOUS FUNCTIONS; FIXED ANGLES; INCIDENCE ANGLES; INITIAL THICKNESS; KRETSCHMANN CONFIGURATION; LAYER THICKNESS; MEASUREMENT PROTOCOL; MULTILAYER STRUCTURES; NANOMETRICS; NEW APPROACHES; OXYGEN-RICH ATMOSPHERES; REFLECTIVITY CURVE; SENSING DEVICES; SILVER FILM; SILVER OXIDE LAYERS; TOTAL INTERNAL REFLECTIONS; WAVE POLARIZATIONS; KRETSCHMANN;

MAGNETIC FILMS; METALLIC FILMS; MULTILAYERS; OPTICAL WAVEGUIDES; OXIDES; OXYGEN; PLASMONS; POLARIZATION; REFLECTION; REFRACTIVE INDEX; SENSORS; SHEAR WAVES; SILVER OXIDES; SURFACE PLASMON RESONANCE; VISCOSITY MEASUREMENT; WAVEGUIDES; FILM PREPARATION; FILM THICKNESS;

SILVER; SURFACE PLASMON RESONANCE;

EID: 77950578477     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/2040-8978/12/4/045002     Document Type: Article

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