|
Volumn 81, Issue 3, 2004, Pages 379-395
|
Preparation and study of structural and optical properties of CSVT deposited CuInSe2 thin films
|
Author keywords
Chemical vapour transport; CuInSe2; Thin films
|
Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CRYSTAL STRUCTURE;
ELECTRON MICROSCOPES;
LATTICE CONSTANTS;
LIGHT ABSORPTION;
POLYCRYSTALLINE MATERIALS;
REACTION KINETICS;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
SPECTROPHOTOMETERS;
TEMPERATURE MEASUREMENT;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CHEMICAL VAPOR TRANSPORT;
CUINSE2;
DISLOCATION DENSITY;
COPPER COMPOUNDS;
|
EID: 1042304376
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2003.11.014 Document Type: Conference Paper |
Times cited : (39)
|
References (37)
|