Microstructure tuning of epitaxial BaTiO3 - x thin films grown using laser molecular-beam epitaxy by varying the oxygen pressure

Thin Solid Films

Volumn 518, Issue 14, 2010, Pages 3669-3673

  Zhu, Y L ^a   Zheng, S J ^a   Chen, D ^a   Ma, X L ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

BaTiO3 x, oxides; Laser molecular beam epitaxy; Thin films, oxygen pressure, 111 twins, microstructure; Transmission electron microscopy; X ray diffraction

Indexed keywords

ELECTRICAL PROPERTY; EPITAXIAL THIN FILMS; EXCESS OXYGEN; HIGH DENSITY; LASER MOLECULAR BEAM EPITAXY; METALLIC BEHAVIORS; MICROSCOPIC STUDY; MICROSTRUCTURAL PROPERTIES; NANOTWINS; OXYGEN DEFICIENCY; OXYGEN PRESSURE; PLANAR DEFECT; SRTIO; THREADING DISLOCATION; TRANSMISSION ELECTRON;

BARIUM COMPOUNDS; CRYSTAL GROWTH; DEFECTS; ELECTRIC PROPERTIES; EPITAXIAL FILMS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR OXYGEN; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM WIRES; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

OXYGEN VACANCIES;

EID: 77950538014     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.09.103     Document Type: Article

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